发明名称 CONTROL SYSTEM OF WAFER POLISHING APPARATUS
摘要 PURPOSE: A control system of a wafer polishing apparatus and a polishing method using the same are provided to secure uniform patterns by controlling the shape of a metal plate. CONSTITUTION: A metal plate(300) is arranged on a base plate(200). A pattern is formed in the metal plate. A pattern processing part(400) is arranged on the metal plate. A control part controls the movement of the pattern processing part. A three shaft driving part(500) operates the pattern processing part.
申请公布号 KR101247854(B1) 申请公布日期 2013.03.26
申请号 KR20110091769 申请日期 2011.09.09
申请人 发明人
分类号 H01L21/304 主分类号 H01L21/304
代理机构 代理人
主权项
地址