发明名称
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor apparatus which can facilitate checking of the quality of bonding of metal connection boards through a bonding material, and to provide a method of manufacturing the same. <P>SOLUTION: A semiconductor apparatus 10 principally includes a semiconductor device 12, an island 14 for mounting the semiconductor device 12, a lead 20 electrically connected with the semiconductor device 12 through a metal connection board 16, and a resin 38 for sealing the semiconductor device 12. A recess 28 is provided at the end of the metal connection board 16 and the quality of connection can be determined by confirming existence of a bonding material 31 exposed from the recess 28. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP5165302(B2) 申请公布日期 2013.03.21
申请号 JP20070199588 申请日期 2007.07.31
申请人 发明人
分类号 H01L23/28;H01L21/60 主分类号 H01L23/28
代理机构 代理人
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