发明名称 Semiconductor device, semiconductor integrated circuit, SRAM, and method for producing Dt-MOS transistor
摘要 A semiconductor device includes a silicon substrate; an element isolation region; an element region including a first well; a contact region; a gate electrode extending from the element region to a sub-region of the element isolation region between the element region and the contact region; a source diffusion region; a drain diffusion region; a first insulating region contacting a lower end of the source diffusion region; a second insulating region contacting a lower end of the drain diffusion region; and a via plug configured to electrically connect the gate electrode with the contact region. The first well is disposed below the gate electrode and is electrically connected with the contact region via the silicon substrate under the sub-region. The lower end of the element isolation region except the sub-region is located lower than the lower end of the first well.
申请公布号 US8399932(B2) 申请公布日期 2013.03.19
申请号 US201113118918 申请日期 2011.05.31
申请人 YOSHIDA EIJI;YAMAGUCHI AKIHISA;FUJITSU SEMICONDUCTOR LIMITED 发明人 YOSHIDA EIJI;YAMAGUCHI AKIHISA
分类号 H01L21/70 主分类号 H01L21/70
代理机构 代理人
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