METHOD OF CHARACTERISING THE SENSITIVITY OF AN ELECTRONIC COMPONENT SUBJECTED TO IRRADIATION CONDITIONS

摘要

The aim of the invention is a method of selecting a piece of electronic equipment comprising at least an electronic component (101), said electronic equipment potentially being subjected to irradiation conditions listed in predetermined specifications, the method comprising a phase for the characterisation of a sensitivity parameter of the electronic component (101) to these irradiation conditions, this phase comprising: - an irradiation step (210) of irradiating the electronic component (101) with a source of ionizing radiation (100) having the known irradiation characteristics and geometry, - a step (220) of measuring a set of operating values of the electronic component (101) during this irradiation step, said method being characterised in that: - the irradiation step comprises measurements of the sensitivity of the electronic component (101) for a number of irradiation conditions lower than all of the conditions listed in the specifications, - the method further comprises a step (240) of extrapolating the measured results to the other irradiation conditions of the specifications.