发明名称 NITRIDE SEMICONDUCTOR DEVICE, NITRIDE SEMICONDUCTOR WAFER, AND METHOD FOR MANUFACTURING NITRIDE SEMICONDUCTOR LAYER
摘要 According to one embodiment, a nitride semiconductor device includes a foundation layer, a first stacked intermediate layer, and a functional layer. The foundation layer includes an AlN buffer layer formed on a substrate. The first stacked intermediate layer is provided on the foundation layer. The first stacked intermediate layer includes a first AlN intermediate layer provided on the foundation layer, a first AlGaN intermediate layer provided on the first AlN intermediate layer, and a first GaN intermediate layer provided on the first AlGaN intermediate layer. The functional layer is provided on the first stacked intermediate layer. The first AlGaN intermediate layer includes a first step layer in contact with the first AlN intermediate layer. An Al composition ratio in the first step layer decreases stepwise in a stacking direction from the first AlN intermediate layer toward the first step layer.
申请公布号 US2013062612(A1) 申请公布日期 2013.03.14
申请号 US201213407169 申请日期 2012.02.28
申请人 SHIODA TOMONARI;HUNG HUNG;HWANG JONGIL;YOSHIDA HISASHI;SUGIYAMA NAOHARU;NUNOUE SHINYA;KABUSHIKI KAISHA TOSHIBA 发明人 SHIODA TOMONARI;HUNG HUNG;HWANG JONGIL;YOSHIDA HISASHI;SUGIYAMA NAOHARU;NUNOUE SHINYA
分类号 H01L29/20;H01L21/20 主分类号 H01L29/20
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