| 摘要 |
The disclosed embodiment relates to a system and method for mapping trends in defects that occur during a project. The method comprised processing defect information related to defects that occurred during a project over a set period of time, the defect information including classification information regarding categories into which the defects are classified, processing at historical defect information and/or historical classification information, wherein the historical defect information includes information related to historical defects that occurred during the project prior to the set period of time and the historical classification information includes information related to categories into which the historical defects are classified, comparing the defect information and/or the classification information with the historical defect information and/or the historical classification information, and determining trends based on the comparison between the defect information and/or the classification information and the historical defect information and/or the historical classification information.
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