发明名称 RESISTANCE CHANGING MEMORY DEVICE AND THEREFOR METHOD OF CURRENT TRIMMING
摘要 PURPOSE: A resistance change memory device and a current trimming method thereof are provided to increase the yield of the resistance change memory device by minimizing a reset program error or a set recovery program error. CONSTITUTION: A resistance change memory device includes a writing circuit(20) and an array(70) of resistance change memory cells. The writing circuit resets the selected memory cells with a high resistant state by applying a reset current to the selected memory cell in the array of the resistance memory cells in a program operation mode. The level of a reset current depends on an initial reset current distribution about the array of the resistance change memory cells.
申请公布号 KR20130021095(A) 申请公布日期 2013.03.05
申请号 KR20110083412 申请日期 2011.08.22
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, JUNG HYUK;HA, DAE WON;SIM, KYU RIE
分类号 G11C13/00;G11C16/10 主分类号 G11C13/00
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