| 摘要 |
<P>PROBLEM TO BE SOLVED: To efficiently detect identification information provided in a substrate in a short time by detecting means. <P>SOLUTION: Substrate width data is employed as substrate attribute data indicating a characteristic of a substrate and the substrate width data and substrate ID coordinates are associated with each other through a representative program by a substrate attribute list and a substrate ID coordinate list. In order to read a substrate ID provided in the substrate carried into a mounting machine, the substrate width data is acquired by measuring a substrate width first, only candidates of the substrate ID coordinates are extracted from the substrate ID coordinates listed up in the substrate ID coordinate list on the basis of the substrate width data and the substrate ID is read by moving a substrate recognition camera on the basis of the extracted substrate ID coordinate data. Therefore the number of movement of the substrate recognition camera is reduced and positioning of the substrate recognition camera is efficiently performed in a short time, thereby significantly reducing time required for substrate ID reading processing. <P>COPYRIGHT: (C)2013,JPO&INPIT |
