发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a manufacturing method of a semiconductor device capable of improving productivity and reliability. <P>SOLUTION: A manufacturing method of a semiconductor device 1 comprises the steps of: preparing a laminate 3 obtained by laminating a base material 10, a resin layer 11, a semiconductor chip 12, a resin layer 13, a semiconductor chip 14, a resin layer 15, a semiconductor chip 16, a resin layer 17, and a semiconductor chip 18; and soldering between terminals 101 and 121, between terminals 122 and 141, between terminals 142 and 161, and between terminals 162 and 181 (terminals for connection) by heating the laminate 3 at a temperature higher than or equal to the melting points of solder layers 121A, 141A, 161A, and 181A of the laminate 3. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013045945(A) 申请公布日期 2013.03.04
申请号 JP20110183662 申请日期 2011.08.25
申请人 SUMITOMO BAKELITE CO LTD 发明人 NAKAMURA KENSUKE
分类号 H01L25/065;H01L25/07;H01L25/18 主分类号 H01L25/065
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