发明名称 THERMAL CYCLE DEVICE AND ABNORMALITY DETERMINATION METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a thermal cycle device capable of determining whether or not a reaction liquid is in a state in which a desired thermal cycle can be applied to the reaction liquid, and further to provide an abnormality determination method of the thermal cycle device. <P>SOLUTION: The thermal cycle device includes: a mounting section for mounting a reaction vessel that is filled with a reaction liquid and a liquid having a specific gravity different from that of the reaction liquid and not mixed with the reaction liquid and includes a flow passage being moved along an inner wall which the reaction liquid faces; a temperature gradient forming section for forming a temperature gradient with respect to the flow passage in a direction in which the reaction liquid is moved; a driving mechanism for switching dispositions of the mounting section and the temperature gradient forming section between a first disposition and a second disposition having a lowest position of the flow passage in a direction in which gravity acts different from that of the first disposition; a detecting section for detecting intensity of light having a predetermined wavelength; and a determining section for determining whether or not a state of the reaction vessel is abnormal on the basis of the intensity of light detected by the detecting section. Either the reaction liquid or the liquid not mixed with the reaction liquid filled in the reaction vessel includes a fluorescent material emitting light having the predetermined wavelength. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013044661(A) 申请公布日期 2013.03.04
申请号 JP20110183376 申请日期 2011.08.25
申请人 SEIKO EPSON CORP 发明人 TAKAGI FUMIO
分类号 G01N35/00;C12M1/00;G01N1/28;G01N21/64 主分类号 G01N35/00
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