发明名称 |
SEMICONDUCTOR WAFER, LIGHT-RECEIVING ELEMENT, LIGHT-RECEIVING ELEMENT ARRAY, HYBRID-TYPE DETECTION DEVICE, OPTICAL SENSOR DEVICE, AND PROCESS FOR PRODUCTION OF SEMICONDUCTOR WAFER |
摘要 |
A light-receiving element includes an InP substrate 1, a light-receiving layer 3 having an MQW and located on the InP substrate 1, a contact layer 5 located on the light-receiving layer 3, a p-type region 6 extending from a surface of the contact layer 5 to the light-receiving layer, and a p-side electrode 11 that forms an ohmic contact with the p-type region. The light-receiving element is characterized in that the MQW has a laminated structure including pairs of an InxGa1-xAs (0.38≰x≰0.68) layer and a GaAs1-ySby (0.25≰y≰0.73) layer, and in the GaAs1-ySby layer, the Sb content y in a portion on the InP substrate side is larger than the Sb content y in a portion on the opposite side.
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申请公布号 |
US2013048838(A1) |
申请公布日期 |
2013.02.28 |
申请号 |
US201013640922 |
申请日期 |
2010.12.03 |
申请人 |
MORI HIROKI;IGUCHI YASUHIRO;INADA HIROSHI;NAGAI YOUICHI;MIURA KOUHEI;NAKAHATA HIDEAKI;AKITA KATSUSHI;ISHIZUKA TAKASHI;FUJII KEI;SUMITOMO ELECTRIC INDUSTRIES, LTD. |
发明人 |
MORI HIROKI;IGUCHI YASUHIRO;INADA HIROSHI;NAGAI YOUICHI;MIURA KOUHEI;NAKAHATA HIDEAKI;AKITA KATSUSHI;ISHIZUKA TAKASHI;FUJII KEI |
分类号 |
H01L31/101;H01L31/18;H01L33/06 |
主分类号 |
H01L31/101 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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