| 摘要 |
Techniques are generally described for transitioning a Finite State Machine (FSM) of an integrated circuit from a first state to a second state or a replicated variant of the second state in lieu of the second state, and out of the replicated variant of the second state, using a robust physically unclonable function (PUF), an event generator and a control block of the IC. In various embodiments, the techniques leverage on manufacturing variability of the IC. In various embodiments, the techniques are employed to control activation or deactivation of the IC. Other embodiments may be disclosed and claimed.
|
