发明名称 Vertical double diffused MOS transistor with a trench gate structure
摘要 A semiconductor device of the present invention includes vertical double diffused MOS transistor. A gate electrode of the vertical double diffused MOS transistor is disposed within a trench formed on a semiconductor substrate and projects from a surface of the semiconductor substrate. On a side surface of the gate electrode, a side wall is formed. On the surface of the semiconductor substrate and a surface of the gate electrode, a metal silicide film is formed.
申请公布号 US8384150(B2) 申请公布日期 2013.02.26
申请号 US20060604889 申请日期 2006.11.28
申请人 ROHM CO., LTD.;MIFUJI MICHIHIKO;MARUYAMA RYUTA;HINO MASAKI 发明人 MIFUJI MICHIHIKO;MARUYAMA RYUTA;HINO MASAKI
分类号 H01L29/66 主分类号 H01L29/66
代理机构 代理人
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