发明名称 |
Vertical double diffused MOS transistor with a trench gate structure |
摘要 |
A semiconductor device of the present invention includes vertical double diffused MOS transistor. A gate electrode of the vertical double diffused MOS transistor is disposed within a trench formed on a semiconductor substrate and projects from a surface of the semiconductor substrate. On a side surface of the gate electrode, a side wall is formed. On the surface of the semiconductor substrate and a surface of the gate electrode, a metal silicide film is formed.
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申请公布号 |
US8384150(B2) |
申请公布日期 |
2013.02.26 |
申请号 |
US20060604889 |
申请日期 |
2006.11.28 |
申请人 |
ROHM CO., LTD.;MIFUJI MICHIHIKO;MARUYAMA RYUTA;HINO MASAKI |
发明人 |
MIFUJI MICHIHIKO;MARUYAMA RYUTA;HINO MASAKI |
分类号 |
H01L29/66 |
主分类号 |
H01L29/66 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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