| 摘要 |
A method for testing an image capturing device with quality parameters includes providing a predetermined criteria for the variations in images and quality parameters corresponding to a specific target-object, capturing a test image corresponding to the same target object by an image capturing device to be tested, and retrieving a standardized image and a test image located at the same position by a standard image unit and a test image unit, respectively, thereby comparing quality parameters of the standard image unit and the test image unit on the same position to accurately detect and determine any abnormity in the image capturing device.
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