| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a test circuit which can be manufactured by a further simple designing method. <P>SOLUTION: A test circuit 100 is provided with a substrate, and a wiring portion and a tested device portion 10 formed on the substrate. In the test circuit 100, an extending direction of a straight line L1 connecting a rotation center position O in a pattern forming surface of a tested device body and a plurality of connection electrodes 13a-13d is tilted by a predetermined angle to an extending direction of a wiring 21. Furthermore, the plurality of the connection electrodes 13a-13d is disposed at a position keeping the connection between the plurality of the connection electrodes 13a-13d and a plurality of wirings 21-24 even when the tested device body and the plurality of the connection electrodes 13a-13d are rotated by 90 degrees within the pattern forming surface. <P>COPYRIGHT: (C)2013,JPO&INPIT |
