发明名称 |
USER INTERFACE FOR ELECTRON MICROSCOPE |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide an easy-to-use user interface for operation of a scanning electron microscope device. <P>SOLUTION: Provided is a user interface for operation of a scanning electron microscope device that combines low magnification reference images and high magnification images on the same screen to enable a user who is not used to the high magnification images of electron microscopes to readily determine where on a sample an image is being obtained and to understand a relationship between that image and the rest of the sample. The user can change fields of view of an electron image to obtain a different image of the sample by inputting instructions through a touch screen. <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2013033760(A) |
申请公布日期 |
2013.02.14 |
申请号 |
JP20120248422 |
申请日期 |
2012.11.12 |
申请人 |
FEI CO |
发明人 |
BIERHOFF MART PETRUS MARIA;BUIJSSE BART;KOOIJMAN CORNELIS SANDER;VAN LEEUWEN HUGO;TAPPEL HENDRIK GEZINES;SANFORD COLIN AUGUST;STOKS SANDER RICHARD MARIE;BERGER STEVEN;BORMANS BEN JACOBUS MARIE;DRIESSEN KOEN ARNOLDUS WILHELMUS;PERSOON JOHANNES ANTONIUS HENDRICUS WILHELMUS GERARDUS |
分类号 |
H01J37/24;H01J37/18;H01J37/21;H01J37/22;H01J37/28 |
主分类号 |
H01J37/24 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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