发明名称 USER INTERFACE FOR ELECTRON MICROSCOPE
摘要 <P>PROBLEM TO BE SOLVED: To provide an easy-to-use user interface for operation of a scanning electron microscope device. <P>SOLUTION: Provided is a user interface for operation of a scanning electron microscope device that combines low magnification reference images and high magnification images on the same screen to enable a user who is not used to the high magnification images of electron microscopes to readily determine where on a sample an image is being obtained and to understand a relationship between that image and the rest of the sample. The user can change fields of view of an electron image to obtain a different image of the sample by inputting instructions through a touch screen. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013033760(A) 申请公布日期 2013.02.14
申请号 JP20120248422 申请日期 2012.11.12
申请人 FEI CO 发明人 BIERHOFF MART PETRUS MARIA;BUIJSSE BART;KOOIJMAN CORNELIS SANDER;VAN LEEUWEN HUGO;TAPPEL HENDRIK GEZINES;SANFORD COLIN AUGUST;STOKS SANDER RICHARD MARIE;BERGER STEVEN;BORMANS BEN JACOBUS MARIE;DRIESSEN KOEN ARNOLDUS WILHELMUS;PERSOON JOHANNES ANTONIUS HENDRICUS WILHELMUS GERARDUS
分类号 H01J37/24;H01J37/18;H01J37/21;H01J37/22;H01J37/28 主分类号 H01J37/24
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