发明名称 |
Device and method for radiometric measurement of a plurality of samples |
摘要 |
The invention relates to a method for photometrically investigating sample radiations of at least one sample, which are caused by the radiation of N emitter elements of at least one radiation element wherein said N emitter elements are emitting radiation during time periods which at least partially overlap, to detect the sample radiation of at least two samples as a sum signal during time periods which at least partially overlap and to evaluate the sample radiation of at least one individual sample from said sum signal.
|
申请公布号 |
US8374802(B2) |
申请公布日期 |
2013.02.12 |
申请号 |
US20080675764 |
申请日期 |
2008.08.29 |
申请人 |
EPPENDORF AG;TREPTOW RAINER;ECKERT GERD JOACHIM;SCHIRR ANDREAS;SCHLIESSER RAINER;WITTSCHIEF NORBERT |
发明人 |
TREPTOW RAINER;ECKERT GERD JOACHIM;SCHIRR ANDREAS;SCHLIESSER RAINER;WITTSCHIEF NORBERT |
分类号 |
G01N31/00 |
主分类号 |
G01N31/00 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|