发明名称 INDUCTIVE PLASMA SOURCES FOR WAFER PROCESSING AND CHAMBER CLEANING
摘要 Methods and systems for depositing material on a substrate are described. One method may include providing a processing chamber partitioned into a first plasma region and a second plasma region. The method may further include delivering the substrate to the processing chamber, where the substrate may occupy a portion of the second plasma region. The method may additionally include forming a first plasma in the first plasma region, where the first plasma may not directly contact the substrate, and the first plasma may be formed by activation of at least one shaped radio frequency ("RF") coil above the first plasma region. The method may moreover include depositing the material on the substrate to form a layer, where one or more reactants excited by the first plasma may be used in deposition of the material.
申请公布号 WO2013019565(A2) 申请公布日期 2013.02.07
申请号 WO2012US48400 申请日期 2012.07.26
申请人 APPLIED MATERIALS, INC.;LIANG, QIWEI 发明人 LIANG, QIWEI
分类号 H01L21/205;H01L21/3065 主分类号 H01L21/205
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