| 摘要 |
<P>PROBLEM TO BE SOLVED: To efficiently enhance reliability of a semiconductor integrated circuit device at low cost without increasing the number of components. <P>SOLUTION: When a period timer 2 outputs a timer counter signal during execution of a user program, CPU cores 6,7 execute a test program stored in an ASE memory 3 and stores check results thereof in a trace memory 11. A debugging circuit 10 performs comparison processing on the check results stored in the trace memory 11 to determine whether the CPU cores 6, 7 are normal. When the CPU cores 6, 7 are normal, the CPU cores 6, 7 execute the user program again. When the CPU cores 6, 7 are abnormal, the debugging circuit 10 outputs a state signal to a system stop circuit 12. On receiving the state signal, the system stop circuit 12 outputs operation control signals to the CPU cores 6, 7 respectively, and restart processing of a semiconductor integrated circuit device 1 is carried out. <P>COPYRIGHT: (C)2013,JPO&INPIT |
