| 摘要 |
<p>Disclosed is an extensometer for amplifying a measurement of high-temperature structural deformation, wherein mounting blocks (5) are mounted at ends of planes on extending rods (7); the top ends of the extending rods (7) are firmly connected to a surface of a test piece (8); connectors (4) are mounted on inner sides of the mounting blocks (5); a deformation-amplifying mechanism (6) and sensor supports (3) are mounted on the connector (4); a sensor (1) is mounted on the sensor supports (3); and the two connectors (4) are mounted on the same straight line and the straight line is parallel with the straight line joining the top ends of the two extending rods (7), to ensure that the deformation of the test piece is transferred equally to the deformation-amplifying mechanism on the connectors (4). The present invention has very high linearity, resolution and precision, while also having a light structure and a small volume and being convenient to install.</p> |
