发明名称 Strain inspection apparatus for transparent materials
摘要 <p>A strain inspection apparatus (1) for inspecting strain in an object includes a first polarizing plate (7); a second polarizing plate (8) opposing to the first polarizing plate (7) with a predetermined distance being provided therebetween, the second polarizing plate (8) forming on one surface thereof at the side of the first polarizing plate a test surface on which an object to be inspected is placed; a diffusion plate (9) arranged at the other surface of the second polarizing plate (8); an illumination device (10) for irradiating light on the diffusion plate (9) from a side opposite to the side where the second polarizing plate (8) is arranged; a holder (11) for accommodating therein the illumination device (10); and a light source (12) arranged at a bottom surface of the holder (11). The light source (12) is constituted by an LED; and the illumination device constitutes a surface illumination device which is adapted to produce uniform light from light emitted by the LED. The illumination device (10) includes a reflection plate having a plurality of small holes (14) therein.</p>
申请公布号 EP2554963(A2) 申请公布日期 2013.02.06
申请号 EP20120000772 申请日期 2012.02.06
申请人 LUCEO CO., LTD. 发明人 HONDA, UMEHIKO;HANASHIMA, MASAKAZU;TAKAMIYA, MASAHIDE
分类号 G01L1/24;G01N21/958 主分类号 G01L1/24
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