发明名称 Plasma measurement device, plasma system, and method for measuring plasma characteristics
摘要 A plasma measurement device used for measuring plasma characteristics of radio frequency plasma a probe, a connector electronic wire, and a power supply device. The probe is used for entering the radio frequency plasma to measure the plasma characteristics. One end of the connector electronic wire is electrically connected to the probe. The power supply device is electrically connected to another end of the connector electronic wire, and the power supply device is used for providing a voltage to the probe. The connector electronic wire is a specific length, and the connector electronic wire and the radio frequency plasma would generate a standing wave effect. Thus, according to the standing wave effect, the plasma measurement device could eliminate high-frequency interference generated by the radio frequency plasma while measuring the plasma characteristics.
申请公布号 US8368378(B2) 申请公布日期 2013.02.05
申请号 US20100694412 申请日期 2010.01.27
申请人 LUNGHWA UNIVERSITY OF SCIENCE AND TECHNOLOGY;SUNG TA-LUN;LIU CHUNG-MING;TING KUEN;MATSUMURA SHOSAKU;TEII SHINRIKI 发明人 SUNG TA-LUN;LIU CHUNG-MING;TING KUEN;MATSUMURA SHOSAKU;TEII SHINRIKI
分类号 G01N27/66 主分类号 G01N27/66
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