| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a film yield prediction system and method for detecting a defect generated during manufacturing of an optical film and calculating an expected yield of a product. <P>SOLUTION: The yield prediction system includes: a first inspection part for detecting a defect on an optical film during performance of a specific step in a manufacturing process of the optical film and generating first defect data including a position of the detected defect; a second inspection part for detecting a defect on the optical film during the performance of another step in the manufacturing process, which is distinguished from the specific step, and generating second defect data including a position of the detected defect; a data combination part for combining the first defect data and the second defect data; and a yield prediction part for calculating an expected yield of the optical film based on an expected cutting position and an expected cutting size of the optical film by the defect data combined by the data combination part. <P>COPYRIGHT: (C)2013,JPO&INPIT |
