发明名称 |
MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE, AND SUBSTRATE PROCESSING APPARATUS |
摘要 |
<P>PROBLEM TO BE SOLVED: To improve controllability of the composition ratio of a first metal element to a second metal element in a metal oxide film in formation of the metal oxide film containing the first metal element and the second metal element. <P>SOLUTION: A manufacturing method includes: a first step of forming a first metal oxide film containing a first metal element on a substrate by supplying first material containing the first metal element and oxidant into a processing chamber containing the substrate; a second step of forming a second metal oxide film containing the first metal element and a second metal element on the substrate by supplying mixed material of the first material and second material containing a second metal element, and the oxidant into the processing chamber; and a third step of laminating the first metal oxide film and the second metal oxide film alternately on the substrate by repeating the first and second steps alternately to form a third metal oxide film containing the first metal element and the second metal element. <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2013026276(A) |
申请公布日期 |
2013.02.04 |
申请号 |
JP20110156760 |
申请日期 |
2011.07.15 |
申请人 |
HITACHI KOKUSAI ELECTRIC INC |
发明人 |
KITAMURA TADASHI;ITAYA HIDEJI;HORII SADAYOSHI |
分类号 |
H01L21/316;C23C16/40;C23C16/44;H01L21/31;H01L21/8242;H01L27/108 |
主分类号 |
H01L21/316 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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