发明名称 |
AUTOMATIC DETERMINATION METHOD FOR INSPECTION CONDITION/MEASUREMENT CONDITION OF SAMPLE, AND SCANNING MICROSCOPE |
摘要 |
<P>PROBLEM TO BE SOLVED: To solve a problem that proper setting of an irradiation condition is dependent on the discretion of the operator by visually recognizing an image captured after the pre-dose, that is, the setting of an irradiation condition is dependent on individual skills, in preliminary charge (pre-dose) that is used in the inspection or measurement of a pattern having high-aspect-ratio in the depth direction. <P>SOLUTION: A captured image is analyzed while changing an irradiation condition of an electron beam that is used for preliminary charge (pre-dose), and a proper irradiation condition is quantitatively and automatically determined on the basis of the analysis result. <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2013025946(A) |
申请公布日期 |
2013.02.04 |
申请号 |
JP20110158130 |
申请日期 |
2011.07.19 |
申请人 |
HITACHI HIGH-TECHNOLOGIES CORP |
发明人 |
KAWASAKI TAKAHIRO;IEDA KOJI |
分类号 |
H01J37/20;H01J37/22;H01J37/28 |
主分类号 |
H01J37/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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