发明名称 AUTOMATIC DETERMINATION METHOD FOR INSPECTION CONDITION/MEASUREMENT CONDITION OF SAMPLE, AND SCANNING MICROSCOPE
摘要 <P>PROBLEM TO BE SOLVED: To solve a problem that proper setting of an irradiation condition is dependent on the discretion of the operator by visually recognizing an image captured after the pre-dose, that is, the setting of an irradiation condition is dependent on individual skills, in preliminary charge (pre-dose) that is used in the inspection or measurement of a pattern having high-aspect-ratio in the depth direction. <P>SOLUTION: A captured image is analyzed while changing an irradiation condition of an electron beam that is used for preliminary charge (pre-dose), and a proper irradiation condition is quantitatively and automatically determined on the basis of the analysis result. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013025946(A) 申请公布日期 2013.02.04
申请号 JP20110158130 申请日期 2011.07.19
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 KAWASAKI TAKAHIRO;IEDA KOJI
分类号 H01J37/20;H01J37/22;H01J37/28 主分类号 H01J37/20
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