发明名称 WAVELENGTH DISTRIBUTION MEASURING APPARATUS
摘要 Provided is a wavelength distribution measuring apparatus (24), which includes a diffuser plate (52) for dispersing light beams radiated from an object to be measured (11) and a light beam homogenizing optical element (53) for reflecting, by the side surface (53b), at least part of the light beams dispersed by the diffuser plate (52) so that the light beams approximate to the direction of the perpendicular of a light receiving surface and also for guiding the light beams to the light receiving surface, and an optical receiver (56) including a plurality of light receiving elements for detecting the light beams, the light receiving elements being different from one another in spectral sensitivity characteristic. With this configuration, substantially parallel light beams radiated from the object to be measured (11) are homogenized at the light receiving surface including the periphery of the light receiving surface.
申请公布号 US2013027696(A1) 申请公布日期 2013.01.31
申请号 US201213545486 申请日期 2012.07.10
申请人 OLYMPUS CORPORATION;SEKIYAMA KENTARO 发明人 SEKIYAMA KENTARO
分类号 G01J3/28 主分类号 G01J3/28
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