| 摘要 |
<P>PROBLEM TO BE SOLVED: To measure a measuring object gas in a sample gas, such as a xenon gas, with high sensitivity without receiving any influence by background radioactivity while reducing restriction of the sample gas. <P>SOLUTION: A measuring apparatus 1 which measures at least one measuring object gas among a xenon gas, a krypton gas and a radon gas in a sample gas includes: mixing means 34 for mixing the sample gas with an argon gas and/or a helium gas to acquire a mixed gas; reducing means 33 for selectively reducing components other than an inert gas from the mixed gas acquired by the mixing means 34; and an atmospheric air pressure ionization mass analyzer 2 for introducing the mixed gas components of which has been selectively reduced by the reducing means 33 and conducting mass analysis of the introduced gas. <P>COPYRIGHT: (C)2013,JPO&INPIT |
