发明名称 SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD OF USE
摘要 <p>SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITSMETHOD OF USEA cartridge, including a cartridge frame, formations on the cartridge frame for mounting the cartridge frame in a fixed position to an apparatus frame, a contactor support structure, a contactor interface on the contactor support structure, a plurality of terminals, held by the contactor support structure, for contacting contacts on a device, and a plurality of conductors, held by the contactor support structure, connecting the interface to the terminals.FIG. 32</p>
申请公布号 SG186674(A1) 申请公布日期 2013.01.30
申请号 SG20120093894 申请日期 2008.12.15
申请人 AEHR TEST SYSTEMS 发明人 LINDSEY, SCOTT, E.;JOVANOVIC, JOVAN;HENDRICKSON, DAVID, S.;RICHMOND, DONALD, P., II
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