发明名称 METHOD FOR PROCESSING OXIDE SEMICONDUCTOR FILM AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE: A method for processing an oxide semiconductor film and a method for manufacturing a semiconductor device is provided to reduce parasitic capacitance and to implement high speed operation. CONSTITUTION: A reduction film(110) is formed on an oxide semiconductor film(100). Oxygen atoms of the oxide semiconductor film are move to the reduction film. Impurities are injected in the oxide semiconductor film. The reduction film is removed to form a low resistance region on the oxide semiconductor film.</p>
申请公布号 KR20130011975(A) 申请公布日期 2013.01.30
申请号 KR20120079239 申请日期 2012.07.20
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 YAMAZAKI SHUNPEI;OHNO SHINJI;SATO YUICHI;KOEZUKA JUNICHI;TEZUKA SACHIAKI
分类号 H01L21/336;H01L29/78 主分类号 H01L21/336
代理机构 代理人
主权项
地址