发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 A method for manufacturing a MOSFET includes the steps of: introducing an impurity into a silicon carbide layer; forming a carbon layer in a surface layer portion of the silicon carbide layer having the impurity introduced therein, by selectively removing silicon from the surface layer portion; and activating the impurity by heating the silicon carbide layer having the carbon layer formed therein.
申请公布号 US2013023113(A1) 申请公布日期 2013.01.24
申请号 US201213550119 申请日期 2012.07.16
申请人 NATIONAL UNIVERSITY CORPORATION NARA INSTITUTE OFSCIENCE AND TECHNOLOGY;SUMITOMO ELECTRIC INDUSTRIES, LTD.;MASUDA TAKEYOSHI;HATAYAMA TOMOAKI 发明人 MASUDA TAKEYOSHI;HATAYAMA TOMOAKI
分类号 H01L21/22 主分类号 H01L21/22
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