SEMICONDUCTOR INTEGRATED CIRCUIT

摘要

PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit that can improve its transient response characteristics without an excessive increase of layout area of power voltage generation circuit and a test method for such semiconductor circuits. SOLUTION: The semiconductor circuit is equipped with a functional circuit and power voltage generation circuit. In the power voltage generation circuit, a plurality of reference voltages made by a plurality of serially connected resistors and the output voltage of a plurality of differential amplifiers connected in parallel are compared, and the output stage transistor is driven with the gate voltage being varied.