发明名称 TANTALUM SPATTERING TARGET
摘要 <p>Provided is a tantalum sputtering target, in which 1 mass ppm or more and 50 mass ppm or less of boron is contained as an essential component, and of which the purity excluding boron and gas components is 99.998% or higher. Thereby obtained is a high-purity tantalum sputtering target having a uniform and fine structure and enabling plasma stabilization and achievement of superior film evenness (uniformity).</p>
申请公布号 KR20130008089(A) 申请公布日期 2013.01.21
申请号 KR20127032610 申请日期 2011.07.21
申请人 JX NIPPON MINING & METALS CORPORATION 发明人 SENDA SHINICHIRO;FUKUSHIMA ATSUSHI
分类号 C23C14/34 主分类号 C23C14/34
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