| 摘要 |
FIELD: physics.SUBSTANCE: invention relates to a method of determining temperature of the active region of semiconductor light-emitting diodes (LED), which can be used to control quality of LEDs at all production stages. In the disclosed method of determining temperature of the active region of a LED, during temperature calibration of a LED, several curves of wavelength versus temperature are obtained for selected points in the given long-wavelength part of the spectrum of the radiation of the LED. The spectrum of the LED is then measured at a given value of forward current and that spectrum is used to determine the wavelength value in the selected points in the given long-wavelength part of the spectrum. Further, the calibration curves are used to determine temperature for each selected point and in order to calculate the exact temperature of the active region of the LED, its average value is obtained.EFFECT: method increases accuracy of determining temperature, which provides reliable, quality, nondestructive, cheap and automated inspection of finished LEDs, displays, lamps and arrays based on said LEDs.1 cl, 4 dwg, 3 tbl, 1 ex |
