发明名称 |
METHOD OF FORMING CAPACITOR STRUCTURE AND SILICON ETCHING LIQUID USED IN THE SAME |
摘要 |
PURPOSE: A method for forming a capacitor structure and a silicon etching solution used in the same are provided to efficiently and accurately remove amorphous silicon or polycrystal silicon. CONSTITUTION: A method for forming a capacitor structure is as follows. A first coat film(1) and a second coat film(2) are formed on a silicon wafer(3). A photoresist(4) is patterned and opened using anisotropic dry etching technique to form concave portions(Ka). A conductive film is formed along the wall surfaces of the concave portions and the top surface of the second coat film. A laying film for protecting the conductive film is formed on the conductive film. The second coat film and the laying film are removed using wet etching technique. A capacitor structure is formed by successively forming a lower electrode, a capacity insulation layer, and an upper electrode.
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申请公布号 |
KR20130007419(A) |
申请公布日期 |
2013.01.18 |
申请号 |
KR20120057320 |
申请日期 |
2012.05.30 |
申请人 |
FUJIFILM CORPORATION |
发明人 |
MIZUTANI ATSUSHI;YOSHII AKIKO;INABA TADASHI |
分类号 |
H01L21/306;H01L21/8242;H01L27/108 |
主分类号 |
H01L21/306 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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