发明名称 METHOD FOR MANUFACTURING REVERSE BLOCKING INSULATED GATE TYPE BIPOLAR TRANSISTOR
摘要 <P>PROBLEM TO BE SOLVED: To provide a method for manufacturing a reverse blocking insulated gate type bipolar transistor in which a separation layer used for curving the terminal end of high breakdown voltage pn junction in the reverse direction and extending the curved terminal end onto the surface, and ensuring of the high breakdown voltage in the reverse direction and reduction in leakage current during reverse bias are possible. <P>SOLUTION: A tapered groove is formed by anisotropic alkaline etching so that the semiconductor substrate thickness between bottoms of the tapered grooves formed of one main surface and the other main surface becomes 60 &mu;m or more. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013012651(A) 申请公布日期 2013.01.17
申请号 JP20110145492 申请日期 2011.06.30
申请人 FUJI ELECTRIC CO LTD 发明人 OGINO MASAAKI
分类号 H01L21/336;H01L29/06;H01L29/12;H01L29/739;H01L29/78 主分类号 H01L21/336
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