发明名称 |
X-ray fluorescence analyzer having means for producing lowered pressure, and an X-ray fluorescence measurement method using lowered pressure |
摘要 |
<p>An X-ray fluorescence analyzer has a structure that defines a chamber (102, 505). There is a window (103) to the chamber in a surface that is to come next to a sample (101) outside the chamber. The window (103) comprises a foil that is permeable to X-rays. A detector (104) receives fluorescent X-rays through said window (103). A low pressure source (508) is coupled to the chamber (102, 505) and configured to controllably lower the pressure of a gaseous medium in the chamber (102, 505) to a pressure value between 760 torr and 10 torr. The X-ray fluorescence analyzer maintains a lowered pressure of a value between 760 torr and 10 torr in the chamber (102, 505) for the duration of an X-ray fluorescence measurement.</p> |
申请公布号 |
EP1852696(B1) |
申请公布日期 |
2013.01.16 |
申请号 |
EP20070107430 |
申请日期 |
2007.05.03 |
申请人 |
OXFORD INSTRUMENTS ANALYTICAL OY |
发明人 |
PUUSAARI, ERKKI;RINTAMAEKI, HANNU |
分类号 |
G01N23/223 |
主分类号 |
G01N23/223 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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