发明名称 Method of fabricating a gallium nitride merged P-I-N schottky (MPS) diode by regrowth and etch back
摘要 An MPS diode includes a III-nitride substrate characterized by a first conductivity type and a first dopant concentration and having a first side and a second side. The MPS diode also includes a III-nitride epitaxial structure comprising a first III-nitride epitaxial layer coupled to the first side of the substrate, wherein a region of the first III-nitride epitaxial layer comprises an array of protrusions. The III-nitride epitaxial structure also includes a plurality of III-nitride regions of a second conductivity type, each partially disposed between adjacent protrusions. Each of the plurality of III-nitride regions of the second conductivity type comprises a first section laterally positioned between adjacent protrusions and a second section extending in a direction normal to the first side of the substrate. The MPS diode further includes a first metallic structure electrically coupled to one or more of the protrusions and to one or more of the second sections.
申请公布号 US9397186(B2) 申请公布日期 2016.07.19
申请号 US201514602125 申请日期 2015.01.21
申请人 Avogy, Inc. 发明人 Raj Madhan M.;Alvarez Brian;Bour David P.;Edwards Andrew P.;Nie Hui;Kizilyalli Isik C.
分类号 H01L21/328;H01L21/329;H01L29/868;H01L29/872;H01L29/66;H01L29/06;H01L29/20;H01L21/02 主分类号 H01L21/328
代理机构 Kilpatrick Townsend & Stockton LLP 代理人 Kilpatrick Townsend & Stockton LLP
主权项 1. A method for fabricating an MPS diode, the method comprising: providing a III-nitride substrate of a first conductivity type having a first surface and a second surface opposing the first surface; forming a first III-nitride epitaxial layer of the first conductivity type coupled to the first surface of the III-nitride substrate, the first III-nitride epitaxial layer having a first surface adjacent the first surface of the III-nitride substrate and a second surface opposing the first surface; forming a mask pattern coupled to the second surface of the first III-nitride epitaxial layer to define etch areas; etching the etch areas to form a plurality of recessed regions extending to a predetermined depth into the first III-nitride epitaxial layer; regrowing a second III-nitride epitaxial layer that fills the recessed regions and extends to a predetermined height from the second surface of the first III-nitride epitaxial layer, wherein the second III-nitride epitaxial layer is lattice matched with the first III-nitride epitaxial layer; forming a second mask pattern coupled to the second III-nitride epitaxial layer to define second etch areas; etching the second etch areas to define a plurality of regrown regions extending in a direction normal to the second surface of the first III-nitride epitaxial layer and to expose a plurality of portions of the first III-nitride epitaxial layer; forming a first metallic structure electrically coupled to one or more of the plurality of regrown regions and one or more of the exposed portions of the first III-nitride epitaxial layer; and forming a second metallic structure electrically coupled to the second surface of the III-nitride substrate.
地址 San Jose CA US