| 摘要 |
A photovoltaic devices inspection apparatus and method of determining defects in photovoltaic devices that uses electroluminescence can find both the quality of the photovoltaic devices from the state of electroluminescence and the possibility of the photovoltaic devices becoming defective in the future by applying constant electric current to the photovoltaic devices causing electroluminescence of the photovoltaic devices (S7), photographing the light emitted from each photovoltaic cell of the photovoltaic devices (S10), dividing the photographed image of the photovoltaic cell into a bright region and dark region by using a threshold value and displayed as an enhanced image by binarization, analyzing as classifying each photovoltaic cell defect according to defect types and comparing a shape of the dark region with the defect types (S50), determining the existence of the defect to perform a positive-negative quality judgment on the photovoltaic devices, and displaying images of the problematic regions for visual inspection (S16).
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