发明名称 SURFACE POTENTIAL MEASURING APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To provide a surface potential measuring apparatus capable of performing accurate measurement without dependence on a measuring distance from a charging object. <P>SOLUTION: The surface potential measuring apparatus includes a distance sensor 4 for measuring a distance L up to the surface of a charging object T, potential detection means 3 for detecting potential which is surface potential of the charging object and is obtained along an attenuation curve to be attenuated in accordance with a distance from the charging object, and arithmetic means 2. The arithmetic means 2 stores &alpha;=a&times;L+b as an arithmetic expression for calculating correction coefficient &alpha; which is 1 in a reference distance Lb previously set together with a distance L and constants a, b to remove distance dependence of the attenuation curve, calculates the correction coefficient &alpha; based on the distance L detected by the distance sensor 4, multiplies potential Vm detected by the potential detection means 3 by the correction coefficient &alpha; and outputs the multiplied result as the surface potential of the charging object. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013007694(A) 申请公布日期 2013.01.10
申请号 JP20110141513 申请日期 2011.06.27
申请人 KASUGA ELECTRIC WORKS LTD 发明人 TABATA YASUYUKI;NOMURA NOBUO;SUZUKI TERUO;MOGAMI TOMOFUMI;OKAMURA ZENJI;HIROTA TOMOKI;MIGITA KAZUNORI;HASHIMOTO FUMIAKI;NAKAYAMA TOMOKO
分类号 G01R29/12 主分类号 G01R29/12
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