发明名称 Defect measuring apparatus
摘要 PURPOSE: A defection measuring device is provided to precisely measure a defection state with respect to an object metal of a curved surface because a measurement with respect to the object metal of the curved surface is possible without using a terminal moving member. CONSTITUTION: A defection measuring device comprises a terminal-block arrangement part(10), current supplying parts(SW1,Vd,Va), and measuring parts(11,13,14,15,16,17). A plurality of individual terminal blocks(101,102,10n) where current applying terminals and voltage detecting terminals are formed is installed side by side in the terminal-block arrangement part to be individually moved. The current supplying parts supply current to each current applying terminal of the individual terminal blocks of the terminal-block arrangement part. The measuring parts measure a defection state of a corresponding metal according to voltages from each voltage detecting terminal of individual terminal blocks of the terminal-block arrangement part.
申请公布号 KR101221018(B1) 申请公布日期 2013.01.10
申请号 KR20100097425 申请日期 2010.10.06
申请人 发明人
分类号 G01N27/00;G01N27/20 主分类号 G01N27/00
代理机构 代理人
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