发明名称 SEMICONDUCTOR DEVICE AND PROCESS FOR PRODUCTION THEREOF
摘要 <p>Provided are a semiconductor device which can exhibit properties thereof steadily and has high quality and a process for producing the semiconductor device. The semiconductor device comprises a substrate (1) which has the main surface and silicon carbide layers (2-5). The silicon carbide layers are formed on the main surface of the substrate (1). Each of the silicon carbide layers has a side surface which is an end surface that is inclined against the main surface. The side surface substantially contains either face [03-3-8] or face [01-1-4] when each of the silicon carbide layers is of a hexagonal crystal type, and substantially contains face [100] when each of the silicon carbide layers is of a cubic crystal type.</p>
申请公布号 WO2012017798(A9) 申请公布日期 2013.01.10
申请号 WO2011JP66096 申请日期 2011.07.14
申请人 SUMITOMO ELECTRIC INDUSTRIES, LTD.;MASUDA, TAKEYOSHI 发明人 MASUDA, TAKEYOSHI
分类号 H01L29/12;H01L21/336;H01L29/78 主分类号 H01L29/12
代理机构 代理人
主权项
地址