发明名称 |
SEMICONDUCTOR DEVICE AND PROCESS FOR PRODUCTION THEREOF |
摘要 |
<p>Provided are a semiconductor device which can exhibit properties thereof steadily and has high quality and a process for producing the semiconductor device. The semiconductor device comprises a substrate (1) which has the main surface and silicon carbide layers (2-5). The silicon carbide layers are formed on the main surface of the substrate (1). Each of the silicon carbide layers has a side surface which is an end surface that is inclined against the main surface. The side surface substantially contains either face [03-3-8] or face [01-1-4] when each of the silicon carbide layers is of a hexagonal crystal type, and substantially contains face [100] when each of the silicon carbide layers is of a cubic crystal type.</p> |
申请公布号 |
WO2012017798(A9) |
申请公布日期 |
2013.01.10 |
申请号 |
WO2011JP66096 |
申请日期 |
2011.07.14 |
申请人 |
SUMITOMO ELECTRIC INDUSTRIES, LTD.;MASUDA, TAKEYOSHI |
发明人 |
MASUDA, TAKEYOSHI |
分类号 |
H01L29/12;H01L21/336;H01L29/78 |
主分类号 |
H01L29/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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