| 摘要 |
<P>PROBLEM TO BE SOLVED: To easily identify an element causing a propagation path of potential variation from a generation source of the potential variation to an observation point from circuit elements and parasitic elements included in a semiconductor integrated circuit device. <P>SOLUTION: Element potential variation information (11), in which potential variation amount of each of circuit elements and parasitic elements included in a semiconductor integrated circuit device is registered, and element disposition information (12), in which a disposed position of each of the circuit elements and parasitic elements is registered, are input. Referring to the element potential variation information (11) and the element disposition information (12), elements corresponding to the potential variation amount larger than a preset potential variation threshold value are selected from the circuit elements and parasitic elements, and information representing the potential variation amount and disposed position of the selected element is registered in element selection information (10). <P>COPYRIGHT: (C)2013,JPO&INPIT |
