摘要 |
<p>The invention relates to a tension micromachine intended to be used in an electronic scanning microscope enclosure or with a diffraction apparatus, comprising two jaws (1) carried by two supports, each jaw (1) being intended to receive an end of a mechanical specimen (4), and means for exerting loads on the supports tending to separate them or to bring them closer together along a longitudinal direction (AL), each jaw (1) comprising a base (2) and a flange (3) for fixing an end (21) of a specimen (4) to the jaw (1) while clamping it between the flange (3) and the base (2) by means of at least two screws (12-5) each passing through the flange (3) and at least a part of the base (2), these two screws (12-15) being situated on either side of the specimen end (21).</p> |
申请人 |
ARTS;PESCI, RAPHAEL;BOMONT, OLIVIER;WARY, MARC;BIANCHIN, JEREMY;SIMON, LIONEL;BOEHM, DANIEL;HECKER, JEAN-MICHEL;PEIFFERT, XAVIER |
发明人 |
PESCI, RAPHAEL;BOMONT, OLIVIER;WARY, MARC;BIANCHIN, JEREMY;SIMON, LIONEL;BOEHM, DANIEL;HECKER, JEAN-MICHEL;PEIFFERT, XAVIER |