| 摘要 |
PURPOSE: A load applied to a device by a pressurization member is prevented from directly applying to a probe portion and a test module by additionally preparing an elastic member in a device test socket. CONSTITUTION: A pin coupling portion(100) is moved to top and bottom about a frame portion(20). The pin coupling portion is combined in the frame portion. A probe portion(200) is respectively inserted into the multiple pin insertion holes(110) of the pin coupling portion. When the pin coupling portion is pressurized downwards by a device, the pin coupling portion is moved downwards by the elastic deformation of an elastic member(260). If the device is removed, the pin coupling is moved upwards by the restoring force of the elastic member. |
