SEMICONDUCTOR DEVICE

摘要

PROBLEM TO BE SOLVED: To provide a semiconductor device which is capable of preventing internal data from being leaked and tampered while performing a scan test.

SOLUTION: A semiconductor device comprises a user circuit including a plurality of flip-flops and a connecting path which constitutes a scan chain by connecting the plurality of flip-flops during a test mode. The connecting path includes a logical operation circuit which logically operates and outputs a non-inverted output value of any one of the plurality of flip-flops or an inverted value connecting path which outputs an inverted output value of any one of the plurality of flip-flops to a post-stage flip-flop.

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