Schaltungsanordnung mit einer Mehrzahl von On-Chip-Überwachungsschaltkreisen und einem Steuerungsschaltkreis und dazugehöriges Verfahren

摘要

Implementations are presented herein that include a plurality of on-chip monitor circuits and a controller. Each of the plurality of on-chip monitor circuits is configured to measure a parameter of a semiconductor chip. The controller is coupled to the plurality of on-chip monitor circuits. The controller is configured to receive a measurement result from at least one of the plurality of on-chip monitor circuits and to control a calibration of another one of the plurality of on-chip monitor circuits in accordance with the measurement result.