发明名称 |
CONTACT PROBE AND PROBE UNIT |
摘要 |
A contact probe having a substantially flat plate shape, used to connect different substrates and having a uniform plate thickness includes: a first contact portion which has a side surface curved in an arc shape and which makes contact with one substrate at the side surface thereof; a second contact portion which has a side surface curved in an arc shape and which makes contact with the other substrate at the side surface thereof; a connection portion which connects the first contact portion and the second contact portion; and an elastic portion which extends from the second contact portion, has a portion curved in an arc shape, and is elastically deformed by a load applied to the first contact portion and the second contact portion.
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申请公布号 |
US2013002281(A1) |
申请公布日期 |
2013.01.03 |
申请号 |
US201113634025 |
申请日期 |
2011.03.14 |
申请人 |
NHK SPRING CO., LTD.;MOTEGI TAKAHIRO;MATSUI AKIHIRO;ISHIKAWA KOJI |
发明人 |
MOTEGI TAKAHIRO;MATSUI AKIHIRO;ISHIKAWA KOJI |
分类号 |
G01R1/067 |
主分类号 |
G01R1/067 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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