发明名称 Etching agent, etching method and liquid for preparing etching agent
摘要 <p>The present invention is directed to provide an etching agent for a semiconductor substrate, which is capable of etching a tungsten (W)-based metal film on a semiconductor substrate and an etching method using relevant etching agent, and relates to a liquid for preparing the etching agent for a semiconductor substrate composed of a solution comprising (A) hydrogen peroxide, (B) a phosphonic acid chelating agent having a hydroxyl group and not having nitrogen atom, (C) a basic compound, and (D-2) 0.01 to 3 % by weight of two or more kinds of anion species other than phosphonic acid chelating agents having a hydroxyl group and not having nitrogen atom, in which anion species have no oxidizing power, an etching method characterized by etching a tungsten (W)-based metal film on a semiconductor substrate using relevant etching agent for a semiconductor substrate, further, a solution comprising (B) a phosphonic acid chelating agent having a hydroxyl group and not having nitrogen atom, (C) a basic compound, and (D-2) anion species other than phosphonic acid chelating agents having a hydroxyl group and not having a hydroxyl group, in which anion species have no oxidizing power.</p>
申请公布号 EP2540870(A1) 申请公布日期 2013.01.02
申请号 EP20120176615 申请日期 2008.12.19
申请人 WAKO PURE CHEMICAL INDUSTRIES, LTD. 发明人 MATSUDA, OSAMU;KIKUCHI, NOBUYUKI;ICHIRO, HAYASHIDA;SHIRAHATA, SATOSHI
分类号 C23F1/38;C23F1/44;H01L21/3213 主分类号 C23F1/38
代理机构 代理人
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