| 摘要 |
A test apparatus that tests a device under test outputting a data signal and a clock signal indicating a timing at which the data signal is to be sampled, the test apparatus comprising a buffer section that buffers the data signal; a pattern generating section that, for each test period of the test apparatus, generates a control signal and an expected value of the data signal; a reading control section that, for each test period, reads the data signal from the buffer section on a condition that the control signal instructs the reading control section to read data from the buffer section; and a judging section that compares the data signal read by the reading control section to the expected value generated by the pattern generating section. |
