| 摘要 |
PURPOSE: A test mode control circuit of a semiconductor device is provided to reduce power consumption by enabling only the transmission gate circuit unit of a changed test mode control circuit among a plurality of test circuits in a test mode. CONSTITUTION: A test mode enable signal generating unit(110) generates a test mode enable signal in response to a test mode set signal and a plurality of test group selection code signals to select a test circuit. A test mode selection signal control unit(120) receives a test mode selection signal for selecting one among a plurality of test modes and selectively outputs or blocks the received test mode selection signal based on a test mode enable signal level.
|
